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Optical models for the ellipsometric characterization of carbon nitride layers prepared by inverse pulsed laser deposition
Optical models for the ellipsometric characterization of carbon nitride layers prepared by inverse pulsed laser deposition
Optical models for the ellipsometric characterization of carbon nitride layers prepared by inverse pulsed laser deposition
Petrik, P. (Autor:in) / Lohner, T. (Autor:in) / Egerhazi, L. (Autor:in) / Geretovszky, Z. (Autor:in)
APPLIED SURFACE SCIENCE ; 253 ; 173-176
01.01.2006
4 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.35
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