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Optical and X-ray characterization of ferroelectric strontium-bismuth-tantalate (SBT) thin films
Optical and X-ray characterization of ferroelectric strontium-bismuth-tantalate (SBT) thin films
Optical and X-ray characterization of ferroelectric strontium-bismuth-tantalate (SBT) thin films
Fried, M. (Autor:in) / Petrik, P. (Autor:in) / Horvath, Z. E. (Autor:in) / Lohner, T. (Autor:in) / Schmidt, C. (Autor:in) / Schneider, C. (Autor:in) / Ryssel, H. (Autor:in)
APPLIED SURFACE SCIENCE ; 253 ; 349-353
01.01.2006
5 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.35
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