Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
High resolution mapping of strains and rotations using electron backscatter diffraction
High resolution mapping of strains and rotations using electron backscatter diffraction
High resolution mapping of strains and rotations using electron backscatter diffraction
Wilkinson, A. J. (Autor:in) / Meaden, G. (Autor:in) / Dingley, D. J. (Autor:in)
MATERIALS SCIENCE AND TECHNOLOGY -LONDON- ; 22 ; 1271-1278
01.01.2006
8 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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