Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
In-Situ SEM/EBSP Analysis during Annealing in a Pure Aluminum Foil for Capacitor
In-Situ SEM/EBSP Analysis during Annealing in a Pure Aluminum Foil for Capacitor
In-Situ SEM/EBSP Analysis during Annealing in a Pure Aluminum Foil for Capacitor
Kobayashi, M. (Autor:in) / Takayama, Y. (Autor:in) / Kato, H. (Autor:in) / Toda, H. (Autor:in) / Chandra, T. / Tsuzaki, K. / Militzer, M. / Ravindran, C.
01.01.2007
6 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
In-situ EBSP Analysis of Grain Boundary Migration during Recrystallization in Pure Aluminum Foils
British Library Online Contents | 2007
|British Library Online Contents | 1996
|In Situ EBSP Observations of Recrystallization in Commercial Purity Aluminum
British Library Online Contents | 2007
|EBSP study of the annealing behavior of aluminum deformed by equal channel angular processing
British Library Online Contents | 2003
|EBSP Studies of Growth Rates during Recrystallization
British Library Online Contents | 1996
|