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Recrystallization Investigated by X- Ray Diffraction Imaging

Wroblewski, T. / Buffet, A.

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Recrystallization Investigated by X- Ray Diffraction Imaging

Wroblewski, T. / Buffet, A.

Recrystallization Investigated by X- Ray Diffraction Imaging

Wroblewski, T. / Buffet, A.

Zugriff

Zugriff über TIB

Verfügbarkeit in meiner Bibliothek prüfen

Bestellung bei Subito €

Seitennavigation

Dokumentinformationen

Ähnliche Titel

Exportieren, teilen und zitieren

Dokumentinformationen

Titel:

Recrystallization Investigated by X- Ray Diffraction Imaging

Beteiligte:

Wroblewski, T. (Autor:in) / Buffet, A. (Autor:in) / Prangnell, P. B. / Bate, P. S.

Erschienen in:

Fundamentals of Deformation and Annealing: Proceedings of the International Symposium held to coincide with the retirement of Professor John Humphreys in Manchester, UK, 5th - 7th September 2006 ; 631-636

MATERIALS SCIENCE FORUM ; 550

Erscheinungsdatum:

01.01.2007

Format / Umfang:

6 pages

ISSN:

0255-5476

Medientyp:

Aufsatz (Zeitschrift)

Format:

Sprache:

Englisch

Klassifikation:

DDC: 620.11

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