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Microstructural characterisation by X-ray scattering of perovskite-type La0.8Sr0.2MnO3±δ thin films prepared by a dip-coating process
Microstructural characterisation by X-ray scattering of perovskite-type La0.8Sr0.2MnO3±δ thin films prepared by a dip-coating process
Microstructural characterisation by X-ray scattering of perovskite-type La0.8Sr0.2MnO3±δ thin films prepared by a dip-coating process
Lenormand, P. (Autor:in) / Lecomte, A. (Autor:in) / Laberty-Robert, C. (Autor:in) / Ansart, F. (Autor:in) / Boulle, A. (Autor:in)
JOURNAL OF MATERIALS SCIENCE ; 42 ; 4581-4590
01.01.2007
10 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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