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XRD Characterization of the 6H-SiC Single Crystal Grown from Si-C-Ti Ternary Solution
XRD Characterization of the 6H-SiC Single Crystal Grown from Si-C-Ti Ternary Solution
XRD Characterization of the 6H-SiC Single Crystal Grown from Si-C-Ti Ternary Solution
Yashiro, N. (Autor:in) / Kusunoki, K. (Autor:in) / Kamei, K. (Autor:in) / Yauchi, A. (Autor:in) / Wright, N. / Johnson, C. M. / Vassilevski, K. / Nikitina, I. / Horsfall, A.
01.01.2007
4 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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