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Reliability of SiC Power Devices Against Cosmic Radiation-Induced Failure
Reliability of SiC Power Devices Against Cosmic Radiation-Induced Failure
Reliability of SiC Power Devices Against Cosmic Radiation-Induced Failure
Soelkner, G. (Autor:in) / Kaindl, W. (Autor:in) / Treu, M. (Autor:in) / Peters, D. (Autor:in) / Wright, N. / Johnson, C. M. / Vassilevski, K. / Nikitina, I. / Horsfall, A.
01.01.2007
6 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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