Effect of an Electric Field on the Texture and Microstructure Evolution during Annealing of High Reduction Cold-Rolled Ni: Fid-Bau Portal

Effect of an Electric Field on the Texture and Microstructure Evolution during Annealing of High Reduction Cold-Rolled Ni

Li, X.L. / Liu, W. / Godfrey, A. / Liu, Q.

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Effect of an Electric Field on the Texture and Microstructure Evolution during Annealing of High Reduction Cold-Rolled Ni

Li, X.L. / Liu, W. / Godfrey, A. / Liu, Q.

Effect of an Electric Field on the Texture and Microstructure Evolution during Annealing of High Reduction Cold-Rolled Ni

Li, X.L. / Liu, W. / Godfrey, A. / Liu, Q.

Zugriff

Zugriff über TIB

Verfügbarkeit in meiner Bibliothek prüfen

Bestellung bei Subito €

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Dokumentinformationen

Ähnliche Titel

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Dokumentinformationen

Titel:

Effect of an Electric Field on the Texture and Microstructure Evolution during Annealing of High Reduction Cold-Rolled Ni

Beteiligte:

Li, X.L. (Autor:in) / Liu, W. (Autor:in) / Godfrey, A. (Autor:in) / Liu, Q. (Autor:in) / Zhou, Y. / Tu, S.-T. / Xie, X.

Erschienen in:

Progresses in Fracture and Strength of Materials and Structures: Part 1: Selected, peer reviewed papers from the Asian Pacific Conference Fracture and Strength 2006 (APCFS'06), held at Sanya, Hainan Island, China during November 22∼25, 2006 ; 679-682

KEY ENGINEERING MATERIALS ; 353/358

Erscheinungsdatum:

01.01.2007

Format / Umfang:

4 pages

ISSN:

1013-9826

Medientyp:

Aufsatz (Zeitschrift)

Format:

Sprache:

Englisch

Klassifikation:

DDC: 620.11

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