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Determination of the short wavelength cutoff of interferential and confocal microscopes
Determination of the short wavelength cutoff of interferential and confocal microscopes
Determination of the short wavelength cutoff of interferential and confocal microscopes
Kruger-Sehm, R. (Autor:in) / Fruhauf, J. (Autor:in) / Dziomba, T. (Autor:in)
WEAR -LAUSANNE- ; 264 ; 439-443
01.01.2008
5 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11292
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