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Heusler films and multilayers: X-ray resonant magnetic scattering and polarized neutron reflectivity studies on the relation between structure and magnetism
Heusler films and multilayers: X-ray resonant magnetic scattering and polarized neutron reflectivity studies on the relation between structure and magnetism
Heusler films and multilayers: X-ray resonant magnetic scattering and polarized neutron reflectivity studies on the relation between structure and magnetism
Bergmann, A. (Autor:in) / Grabis, J. (Autor:in) / Vadala, M. (Autor:in) / Nefedov, A. (Autor:in) / Westerholt, K. (Autor:in) / Zabel, H. (Autor:in)
INTERNATIONAL JOURNAL OF MATERIALS RESEARCH ; 99 ; 461-470
01.01.2008
10 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
669.9
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