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Corrigendum to "Nanoindentation measurements of the mechanical properties of polycrystalline Au and Ag thin films on silicon substrates: Effects of grain size and film thickness" [Mater. Sci. Eng. A 427 (2006) 232-240]
Corrigendum to "Nanoindentation measurements of the mechanical properties of polycrystalline Au and Ag thin films on silicon substrates: Effects of grain size and film thickness" [Mater. Sci. Eng. A 427 (2006) 232-240]
Corrigendum to "Nanoindentation measurements of the mechanical properties of polycrystalline Au and Ag thin films on silicon substrates: Effects of grain size and film thickness" [Mater. Sci. Eng. A 427 (2006) 232-240]
Cao, Y. (Autor:in) / Allameh, S. (Autor:in) / Nankivil, D. (Autor:in) / Sathiaraj, T. S. (Autor:in) / Otiti, T. (Autor:in) / Soboyejo, W. (Autor:in)
MATERIALS SCIENCE AND ENGINEERING A ; 494 ; 466
01.01.2008
466 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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