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Passivation of structured p-type silicon interfaces: Effect of surface morphology and wet-chemical pre-treatment
Passivation of structured p-type silicon interfaces: Effect of surface morphology and wet-chemical pre-treatment
Passivation of structured p-type silicon interfaces: Effect of surface morphology and wet-chemical pre-treatment
Angermann, H. (Autor:in)
APPLIED SURFACE SCIENCE ; 254 ; 8067-8074
01.01.2008
8 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.35
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