Microstructure Influence on Residual Stresses in Growing Chromia Oxide Films as Determined by In Situ High Temperature Raman Spectroscopy: Fid-Bau Portal

Microstructure Influence on Residual Stresses in Growing Chromia Oxide Films as Determined by In Situ High Temperature Raman Spectroscopy

Kemdehoundja, M. / Grosseau-Poussard, J.L. / Dinhut, J.F. / Bonnet, G.

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Microstructure Influence on Residual Stresses in Growing Chromia Oxide Films as Determined by In Situ High Temperature Raman Spectroscopy

Kemdehoundja, M. / Grosseau-Poussard, J.L. / Dinhut, J.F. / Bonnet, G.

Microstructure Influence on Residual Stresses in Growing Chromia Oxide Films as Determined by In Situ High Temperature Raman Spectroscopy

Kemdehoundja, M. / Grosseau-Poussard, J.L. / Dinhut, J.F. / Bonnet, G.

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Titel:

Microstructure Influence on Residual Stresses in Growing Chromia Oxide Films as Determined by In Situ High Temperature Raman Spectroscopy

Beteiligte:

Kemdehoundja, M. (Autor:in) / Grosseau-Poussard, J.L. (Autor:in) / Dinhut, J.F. (Autor:in) / Bonnet, G. (Autor:in) / Steinmetz, P. / Wright, I.G. / Galerie, A. / Monceau, D. / Mathieu, S.

Erschienen in:

High Temperature Corrosion and Protection of Materials 7 - PART 2 ; 881-888

MATERIALS SCIENCE FORUM ; 595/598

Erscheinungsdatum:

01.01.2008

Format / Umfang:

8 pages

ISSN:

0255-5476

Medientyp:

Aufsatz (Zeitschrift)

Format:

Sprache:

Englisch

Klassifikation:

DDC: 620.11

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