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Characterization of Ti/Al Ohmic Contacts to p-Type 4H-SiC Using Cathodoluminescence and Auger Electron Spectroscopies

Gao, M. / Tumakha, S. P. / Onishi, T. et al. | British Library Online Contents | 2006

Electronic structure of metal/semiconductor interfaces from cathodoluminescence and soft X-ray photoemission spectroscopies

Brillson, L. J. / Vitomirov, I. M. / Raisanen, A. et al. | British Library Online Contents | 1993

A Controllable Nanometer-Sized Valve

Yu, M. / Falconer, J. L. / Amundsen, T. J. et al. | British Library Online Contents | 2007

Nanometer-Sized Nickel Hollow Spheres

Liu, Q. / Liu, H. / Han, M. et al. | British Library Online Contents | 2005