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Simultaneous Atomic Imaging of Atomic Force Microscopy and Scanning Tunneling Microscopy Using Metal Coated Cantilevers
Simultaneous Atomic Imaging of Atomic Force Microscopy and Scanning Tunneling Microscopy Using Metal Coated Cantilevers
Simultaneous Atomic Imaging of Atomic Force Microscopy and Scanning Tunneling Microscopy Using Metal Coated Cantilevers
Sawada, D. (Autor:in) / Hirai, A. (Autor:in) / Sugimoto, Y. (Autor:in) / Abe, M. (Autor:in) / Morita, S. (Autor:in)
MATERIALS TRANSACTIONS ; 50 ; 940-942
01.01.2009
3 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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