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Precise Resistivity Measurement of Submicrometer-Sized Materials by Using TEM with Microprobes
Precise Resistivity Measurement of Submicrometer-Sized Materials by Using TEM with Microprobes
Precise Resistivity Measurement of Submicrometer-Sized Materials by Using TEM with Microprobes
Kawamoto, N. (Autor:in) / Murakami, Y. (Autor:in) / Shindo, D. (Autor:in) / Azehara, H. (Autor:in) / Tokumoto, H. (Autor:in)
MATERIALS TRANSACTIONS ; 50 ; 1572-1575
01.01.2009
4 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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