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Nanotribological characteristics of thin films on phosphorylated 3-aminopropyltriethoxysilane self-assembled monolayer
Nanotribological characteristics of thin films on phosphorylated 3-aminopropyltriethoxysilane self-assembled monolayer
Nanotribological characteristics of thin films on phosphorylated 3-aminopropyltriethoxysilane self-assembled monolayer
Li, J. (Autor:in) / Sheng, X.H. (Autor:in)
MATERIALS TECHNOLOGY ; 25 ; 23-26
01.01.2010
4 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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