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Characterization of inhomogeneous colloidal layers using adapted coherence probe microscopy
Characterization of inhomogeneous colloidal layers using adapted coherence probe microscopy
Characterization of inhomogeneous colloidal layers using adapted coherence probe microscopy
Halter, E. (Autor:in) / Montgomery, P. (Autor:in) / Montaner, D. (Autor:in) / Barillon, R. (Autor:in) / Del Nero, M. (Autor:in) / Galindo, C. (Autor:in) / Georg, S. (Autor:in)
APPLIED SURFACE SCIENCE ; 256 ; 6144-6152
01.01.2010
9 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.35
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Optical characterization of semiconductors containing inhomogeneous layers
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