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Model-Based Correction of Image Distortion in Scanning Electron Microscopy
Model-Based Correction of Image Distortion in Scanning Electron Microscopy
Model-Based Correction of Image Distortion in Scanning Electron Microscopy
Gnieser, D. (Autor:in) / Frase, C.G. (Autor:in) / Bosse, H. (Autor:in) / Tutsch, R. (Autor:in) / Chugui, Y. / Gao, Y. / Fan, K.-C. / Taymanov, R. / Sapozhnikova, K.
01.01.2010
5 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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