Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Accurate measurement of the piezoelectric coefficient of thin films by eliminating the substrate bending effect using spatial scanning laser vibrometry
Accurate measurement of the piezoelectric coefficient of thin films by eliminating the substrate bending effect using spatial scanning laser vibrometry
Accurate measurement of the piezoelectric coefficient of thin films by eliminating the substrate bending effect using spatial scanning laser vibrometry
Leighton, G.J.T. (Autor:in) / Huang, Z. (Autor:in)
SMART MATERIALS AND STRUCTURES ; 19 ; 065011
01.01.2010
65011 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
530
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