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The Fluctuation of Indium Composition in InGaN Based LED Investigated by Atom Probe Tomography (APT)
The Fluctuation of Indium Composition in InGaN Based LED Investigated by Atom Probe Tomography (APT)
The Fluctuation of Indium Composition in InGaN Based LED Investigated by Atom Probe Tomography (APT)
Kim, B.H. (Autor:in) / Gu, G.H. (Autor:in) / Park, C.G. (Autor:in) / Nie, J.-F. / Morton, A.
01.01.2010
4 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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