Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Critical Undeformed Chip Thickness and Cutting Pressure in Relation to Ductile Mode Cutting of KDP Crystal
Critical Undeformed Chip Thickness and Cutting Pressure in Relation to Ductile Mode Cutting of KDP Crystal
Critical Undeformed Chip Thickness and Cutting Pressure in Relation to Ductile Mode Cutting of KDP Crystal
Chen, H.F. (Autor:in) / Zheng, Z.W. (Autor:in) / Dai, Y.F. (Autor:in) / Gao, H. (Autor:in) / Li, X.P. (Autor:in) / Wang, J. / Mathew, P. / Li, X. / Huang, C. / Zhu, H.
01.01.2010
6 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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