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Spectroscopic characterization of b-FeSi2 single crystals and homoepitaxial b-FeSi2 films by XPS and XAS
Spectroscopic characterization of b-FeSi2 single crystals and homoepitaxial b-FeSi2 films by XPS and XAS
Spectroscopic characterization of b-FeSi2 single crystals and homoepitaxial b-FeSi2 films by XPS and XAS
Esaka, F. (Autor:in) / Yamamoto, H. (Autor:in) / Udono, H. (Autor:in) / Matsubayashi, N. (Autor:in) / Yamaguchi, K. (Autor:in) / Shamoto, S. (Autor:in) / Magara, M. (Autor:in) / Kimura, T. (Autor:in)
APPLIED SURFACE SCIENCE ; 257 ; 2950-2954
01.01.2011
5 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.35
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