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Indentation and imprint mapping for the identification of material properties in multi-layered systems
Indentation and imprint mapping for the identification of material properties in multi-layered systems
Indentation and imprint mapping for the identification of material properties in multi-layered systems
Moy, C. K. (Autor:in) / Bocciarelli, M. (Autor:in) / Ringer, S. P. (Autor:in) / Ranzi, G. (Autor:in)
COMPUTATIONAL MATERIALS SCIENCE ; 50 ; 1681-1691
01.01.2011
11 pages
Aufsatz (Zeitschrift)
Englisch
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