Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Accurate displacement field measurement with scanning electron microscopy imaging
Accurate displacement field measurement with scanning electron microscopy imaging
Accurate displacement field measurement with scanning electron microscopy imaging
Arikawa, T. (Autor:in) / Murasawa, G. (Autor:in) / Yoneyama, S. (Autor:in)
01.01.2011
10 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
624.176
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