Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Scratch direction and threshold force in nanoscale scratching using atomic force microscopes
Scratch direction and threshold force in nanoscale scratching using atomic force microscopes
Scratch direction and threshold force in nanoscale scratching using atomic force microscopes
Tseng, A. A. (Autor:in) / Kuo, C. F. (Autor:in) / Jou, S. (Autor:in) / Nishimura, S. (Autor:in) / Shirakashi, J. i. (Autor:in)
APPLIED SURFACE SCIENCE ; 257 ; 9243-9250
01.01.2011
8 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.35
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