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Investigation of TiO~2 Ceramic Surface Conductivity Using Conductive Atomic Force Microscopy
Investigation of TiO~2 Ceramic Surface Conductivity Using Conductive Atomic Force Microscopy
Investigation of TiO~2 Ceramic Surface Conductivity Using Conductive Atomic Force Microscopy
Rubenis, K. (Autor:in) / Kundzins, K. (Autor:in) / Locs, J. (Autor:in) / Ozolins, J. (Autor:in) / Hussainova, I.
01.01.2013
5 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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