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Lifetime Prediction of White OLED Based on MLE Under Lognormal Distribution
Lifetime Prediction of White OLED Based on MLE Under Lognormal Distribution
Lifetime Prediction of White OLED Based on MLE Under Lognormal Distribution
Zhang, J.-P. (Autor:in) / Li, D.-L. (Autor:in) / Wu, W.-L. (Autor:in) / Wu, H. (Autor:in) / Zhu, W.-Q. (Autor:in)
JOURNAL OF TESTING AND EVALUATION ; 41 ; 398-402
01.01.2013
5 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620
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