Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
In situ high-pressure synchrotron X-ray diffraction study of the structural stability in NdVO"4 and LaVO"4
In situ high-pressure synchrotron X-ray diffraction study of the structural stability in NdVO"4 and LaVO"4
In situ high-pressure synchrotron X-ray diffraction study of the structural stability in NdVO"4 and LaVO"4
Errandonea, D. (Autor:in) / Popescu, C. (Autor:in) / Achary, S. N. (Autor:in) / Tyagi, A. K. (Autor:in) / Bettinelli, M. (Autor:in)
MATERIALS RESEARCH BULLETIN ; 50 ; 279-284
01.01.2014
6 pages
Aufsatz (Zeitschrift)
Englisch
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
Epitaxial growth of semiconducting LaVO~3 thin films
British Library Online Contents | 2000
|Growth And Spectral Properties Of Yb^3^+-doped LaVO~4 Crystal
British Library Online Contents | 2006
|