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Computed Tomography Scanning for Quantifying Chipseal Material Volumetrics
Computed Tomography Scanning for Quantifying Chipseal Material Volumetrics
Computed Tomography Scanning for Quantifying Chipseal Material Volumetrics
Kodippily, S. (Autor:in) / Henning, T.F.P. (Autor:in) / Ingham, J.M. (Autor:in) / Holleran, G. (Autor:in)
JOURNAL OF COMPUTING IN CIVIL ENGINEERING ; 28 ; 04014002
01.01.2014
4014002 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
624
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