Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Critical and Normal Depths in Semielliptical Channels
Critical and Normal Depths in Semielliptical Channels
Critical and Normal Depths in Semielliptical Channels
Vatankhah, Ali R. (Autor:in)
Journal of irrigation and drainage engineering ; 141 ; 06015002-06015002
01.01.2015
1 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
627.52
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