Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Ultrahigh-Pressure Watercutting Treatment of Flushed Chip Seals in the United States: Effectiveness and Durability
Ultrahigh-Pressure Watercutting Treatment of Flushed Chip Seals in the United States: Effectiveness and Durability
Ultrahigh-Pressure Watercutting Treatment of Flushed Chip Seals in the United States: Effectiveness and Durability
Lawson, William D. (Autor:in) / Senadheera, Sanjaya P. (Autor:in) / Surles, James G. (Autor:in)
Transportation research record ; 2481 ; 75-82
01.01.2015
8 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
388.072
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