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Frequency Dependence of the Defect Sensitivity of Guided Wave Testing for Efficient Defect Detection at Pipe Elbows
Frequency Dependence of the Defect Sensitivity of Guided Wave Testing for Efficient Defect Detection at Pipe Elbows
Frequency Dependence of the Defect Sensitivity of Guided Wave Testing for Efficient Defect Detection at Pipe Elbows
Yamamoto, Toshihiro (Autor:in) / Furukawa, Takashi (Autor:in) / Nishino, Hideo (Autor:in)
Materials transactions ; 57 ; 397-403
01.01.2016
7 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.1105
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