Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Advanced Transmission Electron Microscopy: Imaging and Diffraction in Nanoscience Jian Min Zuo and John C.H. Spence
Advanced Transmission Electron Microscopy: Imaging and Diffraction in Nanoscience Jian Min Zuo and John C.H. Spence
Advanced Transmission Electron Microscopy: Imaging and Diffraction in Nanoscience Jian Min Zuo and John C.H. Spence
Li, Wanfeng (Autor:in)
MRS bulletin ; 43 ; 310-311
01.01.2018
2 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620
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