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Quantitative determining interface information of nano composite by synchrotron radiation small-angle X-ray scattering
Quantitative determining interface information of nano composite by synchrotron radiation small-angle X-ray scattering
Quantitative determining interface information of nano composite by synchrotron radiation small-angle X-ray scattering
Xia, Xu (Autor:in) / Yin, Jinghua (Autor:in) / Su, Bo (Autor:in) / Hui, David (Autor:in) / Yu, Rentong (Autor:in) / Liu, Xiaoxu (Autor:in)
Composites.Part B, Engineering ; 120 ; 92-96
01.01.2017
5 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.118
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