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Effect of post-growth annealing on the structural, optical and electrical properties of V2O5 nanorods and its fabrication, characterization of V2O5/p-Si junction diode
Effect of post-growth annealing on the structural, optical and electrical properties of V2O5 nanorods and its fabrication, characterization of V2O5/p-Si junction diode
Effect of post-growth annealing on the structural, optical and electrical properties of V2O5 nanorods and its fabrication, characterization of V2O5/p-Si junction diode
kumar, N. Senthil (Autor:in) / Raman, M. Sethu (Autor:in) / Chandrasekaran, J. (Autor:in) / Priya, R. (Autor:in) / Chavali, Murthy (Autor:in) / Suresh, R. (Autor:in)
Materials science in semiconductor processing ; 41 ; 497-507
01.01.2016
11 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.38152
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