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Probing stem cell differentiation using atomic force microscopy
Probing stem cell differentiation using atomic force microscopy
Probing stem cell differentiation using atomic force microscopy
Liang, Xiaobin (Autor:in) / Shi, Xuetao (Autor:in) / Ostrovidov, Serge (Autor:in) / Wu, Hongkai (Autor:in) / Nakajima, Ken (Autor:in)
Applied surface science ; 366 ; 254-259
01.01.2016
6 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.44
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