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Determining the resolution of scanning microwave impedance microscopy using atomic-precision buried donor structures
Determining the resolution of scanning microwave impedance microscopy using atomic-precision buried donor structures
Determining the resolution of scanning microwave impedance microscopy using atomic-precision buried donor structures
Scrymgeour, D.A. (Autor:in) / Baca, A. (Autor:in) / Fishgrab, K. (Autor:in) / Simonson, R.J. (Autor:in) / Marshall, M. (Autor:in) / Bussmann, E. (Autor:in) / Nakakura, C.Y. (Autor:in) / Anderson, M. (Autor:in) / Misra, S. (Autor:in)
Applied surface science ; 423 ; 1097-1102
01.01.2017
6 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.44
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