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Correlation between surface morphology and electrical properties of VO2 films grown by direct thermal oxidation method
Correlation between surface morphology and electrical properties of VO2 films grown by direct thermal oxidation method
Correlation between surface morphology and electrical properties of VO2 films grown by direct thermal oxidation method
Yoon, Joonseok (Autor:in) / Park, Changwoo (Autor:in) / Park, Sungkyun (Autor:in) / Mun, Bongjin Simon (Autor:in) / Ju, Honglyoul (Autor:in)
Applied surface science ; 353 ; 1082-1086
01.01.2015
5 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.44
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