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Corrigendum to 'Enhanced electrical properties of oxide semiconductor thin-film transistors with high conductivity thin layer insertion for the channel region' [Applied Surface Science 396 (2017) 1472–1477]
Corrigendum to 'Enhanced electrical properties of oxide semiconductor thin-film transistors with high conductivity thin layer insertion for the channel region' [Applied Surface Science 396 (2017) 1472–1477]
Corrigendum to 'Enhanced electrical properties of oxide semiconductor thin-film transistors with high conductivity thin layer insertion for the channel region' [Applied Surface Science 396 (2017) 1472–1477]
Thi Nguyen, Cam Phu (Autor:in) / Raja, Jayapal (Autor:in) / Kim, Sunbo (Autor:in) / Jang, Kyungsoo (Autor:in) / Tuan Le, Anh Huy (Autor:in) / Lee, Youn-Jung (Autor:in) / Yi, Junsin (Autor:in)
Applied surface science ; 469 ; 1016
01.01.2019
1016 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.44
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