Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Visualized investigation of defect in cementitious materials with electrical resistance tomography
Visualized investigation of defect in cementitious materials with electrical resistance tomography
Visualized investigation of defect in cementitious materials with electrical resistance tomography
Ren, Hongwei (Autor:in) / Tian, Kaige (Autor:in) / Hong, Shuxian (Autor:in) / Dong, Biqin (Autor:in) / Xing, Feng (Autor:in) / Qin, Lei (Autor:in)
Construction & building materials ; 196 ; 428-436
01.01.2019
9 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
624.18
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