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Structural and ferroelectric properties of P(VDF-TrFE) thin films depending on the annealing temperature
Structural and ferroelectric properties of P(VDF-TrFE) thin films depending on the annealing temperature
Structural and ferroelectric properties of P(VDF-TrFE) thin films depending on the annealing temperature
Seo, Jeongdae (Autor:in) / Son, Jong Yeog (Autor:in) / Kim, Woo-Hee (Autor:in)
MATERIALS LETTERS ; 238 ; 294-297
01.01.2019
4 pages
Aufsatz (Zeitschrift)
Unbekannt
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