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Monte Carlo raytracing method for calculating secondary electron emission from micro-architected surfaces
Monte Carlo raytracing method for calculating secondary electron emission from micro-architected surfaces
Monte Carlo raytracing method for calculating secondary electron emission from micro-architected surfaces
Alvarado, Andrew (Autor:in) / Chang, Hsing-Yin (Autor:in) / Nadvornick, Warren (Autor:in) / Ghoniem, Nasr (Autor:in) / Marian, Jaime (Autor:in)
Applied surface science ; 478 ; 142-149
01.01.2019
8 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.44
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