Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Immediate development of processing windows for selective electron beam melting using layerwise monitoring via backscattered electron detection
Immediate development of processing windows for selective electron beam melting using layerwise monitoring via backscattered electron detection
Immediate development of processing windows for selective electron beam melting using layerwise monitoring via backscattered electron detection
Pobel, Christoph R. (Autor:in) / Arnold, Christopher (Autor:in) / Osmanlic, Fuad (Autor:in) / Fu, Zongwen (Autor:in) / Körner, Carolin (Autor:in)
MATERIALS LETTERS ; 249 ; 70-72
01.01.2019
3 pages
Aufsatz (Zeitschrift)
Unbekannt
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
Electron Backscattered Diffraction
| British Library Online Contents | 2004
Secondary and backscattered electron yields of polymer surface under electron beam irradiation
| British Library Online Contents | 1997
| British Library Online Contents | 2007
Metallographic Preparation for Electron Backscattered Diffraction
| British Library Online Contents | 2012
Quantitative backscattered electron analysis of cement paste
| Tema Archiv | 1992