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Scanning the Thickness of Conductive and Dielectric Coatings Using Superminiature Eddy Current Probe
Scanning the Thickness of Conductive and Dielectric Coatings Using Superminiature Eddy Current Probe
Scanning the Thickness of Conductive and Dielectric Coatings Using Superminiature Eddy Current Probe
Dmitriev, Sergey (Autor:in) / Ishkov, Alexey (Autor:in) / Malikov, Vladimir (Autor:in) / Katasonov, Alexander (Autor:in) / Fadeev, Denis (Autor:in) / Rykova, Kseniia (Autor:in)
International Scientific and Technical Conference on Architecture and Construction ; 13. ; 2020 ; Novosibirsk
2021
Aufsatz (Konferenz)
Englisch
Scanning the Thickness of Conductive and Dielectric Coatings Using Superminiature Eddy Current Probe
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