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Enhanced D retention in RAFM steel caused by D bubbles formed inside Cr-rich surface layer
To identify the cause for an enhanced D retention in RAFM (reduced-activation ferritic/martensitic) steels with decreasing incident D fluence, ϕD, CLAM steel samples were exposed to D plasma at a low ϕD ∼ 3 × 1023 m−2 in the PISCES-A linear plasma device. At this low ϕD, a Cr-rich surface layer with a thickness of ∼ 10 nm still remains, confirmed with cross-sectional EDX (energy dispersive x-ray spectroscopy) elemental mapping. TEM (transmission electron microscopy) observations of a plasma-exposed surface reveal the formation of D bubbles inside the Cr-rich surface layer, while no D bubbles are seen in an unexposed surface. Furthermore, depth profiling using GDOES (glow discharge optical emission spectroscopy) detects D in the Cr-rich surface layer. These results demonstrate that the D retention at low ϕD is enhanced by D atoms trapped in bubbles created inside the Cr-rich surface layer.
Enhanced D retention in RAFM steel caused by D bubbles formed inside Cr-rich surface layer
To identify the cause for an enhanced D retention in RAFM (reduced-activation ferritic/martensitic) steels with decreasing incident D fluence, ϕD, CLAM steel samples were exposed to D plasma at a low ϕD ∼ 3 × 1023 m−2 in the PISCES-A linear plasma device. At this low ϕD, a Cr-rich surface layer with a thickness of ∼ 10 nm still remains, confirmed with cross-sectional EDX (energy dispersive x-ray spectroscopy) elemental mapping. TEM (transmission electron microscopy) observations of a plasma-exposed surface reveal the formation of D bubbles inside the Cr-rich surface layer, while no D bubbles are seen in an unexposed surface. Furthermore, depth profiling using GDOES (glow discharge optical emission spectroscopy) detects D in the Cr-rich surface layer. These results demonstrate that the D retention at low ϕD is enhanced by D atoms trapped in bubbles created inside the Cr-rich surface layer.
Enhanced D retention in RAFM steel caused by D bubbles formed inside Cr-rich surface layer
D. Nishijima (Autor:in) / M. Tokitani (Autor:in) / R.P. Doerner (Autor:in) / S. Masuzaki (Autor:in) / M. Miyamoto (Autor:in) / D. Nagata (Autor:in) / G.R. Tynan (Autor:in)
2021
Aufsatz (Zeitschrift)
Elektronische Ressource
Unbekannt
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