Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Method for analysis of diffraction profile advanced, is based on use of cumulative intensities corresponding to variable abscissas; nomographs have been constructed; method was applied to perturbations of X-ray pattern due to grinding Sb and ZnO.
Method for analysis of diffraction profile advanced, is based on use of cumulative intensities corresponding to variable abscissas; nomographs have been constructed; method was applied to perturbations of X-ray pattern due to grinding Sb and ZnO.
Profile of diffracted X-rays
Sur le profil des raies de diffraction de rayons X
Tekiz, Y. (Autor:in)
1965
4 pages
Aufsatz (Zeitschrift)
Englisch
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