Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
“Standardless” X-ray diffraction quantitative analysis
Abstract An alternate derivation of Chung's (1974) equation for quantitative compound analysis by X-ray diffraction is presented, and verified from experimental data, to show that for most purposes, no internal standard need be added to a sample material during analysis. The reference intensity constant (k Bi) must be determined for all analyzed components, however, and internal standards must be used or special absorption measurements made for samples containing amorphous components.
“Standardless” X-ray diffraction quantitative analysis
Abstract An alternate derivation of Chung's (1974) equation for quantitative compound analysis by X-ray diffraction is presented, and verified from experimental data, to show that for most purposes, no internal standard need be added to a sample material during analysis. The reference intensity constant (k Bi) must be determined for all analyzed components, however, and internal standards must be used or special absorption measurements made for samples containing amorphous components.
“Standardless” X-ray diffraction quantitative analysis
Davis, Briant L. (Autor:in)
Atmospheric Environment ; 14 ; 217-220
01.09.1979
4 pages
Aufsatz (Zeitschrift)
Elektronische Ressource
Englisch
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