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The invention provides a push-pull structure and a detection method for an opening and closing degree of the push-pull structure. The push-pull structure comprises a plate-shaped piece and a sliding rail, wherein the top or bottom of the plate-shaped piece comprises a partial conductive surface; the sliding rail is connected with the plate-shaped piece in a sliding mode, the surface, making contact with the conductive surface, of the sliding rail comprises at least one detection contact set, and each detection contact set comprises a plurality of detection contacts; and the detection contacts are sequentially contacted with the conductive surface along with the movement of the plate-shaped piece. According to the push-pull structure and the detection method for the opening and closing degree of the push-pull structure in the technical scheme, when the opening and closing degree of the push-pull structure is detected, interference of external factors is avoided, and the accuracy of a detection result is greatly improved.
本申请方案提供一种推拉结构及其开合程度的检测方法,所述推拉结构,包括:板状件,所述板状件的顶部或底部包括部分导电表面;滑动轨道,与所述板状件可滑动地连接,所述滑动轨道与所述导电表面接触的表面包括至少一组检测触点组,每组所述检测触点组包括多个检测触点;所述检测触点随所述板状件的移动与所述导电表面依次接触。本申请技术方案的推拉结构及其开合程度的检测方法在检测推拉结构开合程度时,不易受外界因素干扰,大幅度提高了检测结果的准确性。
The invention provides a push-pull structure and a detection method for an opening and closing degree of the push-pull structure. The push-pull structure comprises a plate-shaped piece and a sliding rail, wherein the top or bottom of the plate-shaped piece comprises a partial conductive surface; the sliding rail is connected with the plate-shaped piece in a sliding mode, the surface, making contact with the conductive surface, of the sliding rail comprises at least one detection contact set, and each detection contact set comprises a plurality of detection contacts; and the detection contacts are sequentially contacted with the conductive surface along with the movement of the plate-shaped piece. According to the push-pull structure and the detection method for the opening and closing degree of the push-pull structure in the technical scheme, when the opening and closing degree of the push-pull structure is detected, interference of external factors is avoided, and the accuracy of a detection result is greatly improved.
本申请方案提供一种推拉结构及其开合程度的检测方法,所述推拉结构,包括:板状件,所述板状件的顶部或底部包括部分导电表面;滑动轨道,与所述板状件可滑动地连接,所述滑动轨道与所述导电表面接触的表面包括至少一组检测触点组,每组所述检测触点组包括多个检测触点;所述检测触点随所述板状件的移动与所述导电表面依次接触。本申请技术方案的推拉结构及其开合程度的检测方法在检测推拉结构开合程度时,不易受外界因素干扰,大幅度提高了检测结果的准确性。
Push-pull structure and detection method for opening and closing degree of push-pull structure
推拉结构及其开合程度的检测方法
ZHAO JIAN (Autor:in)
20.07.2021
Patent
Elektronische Ressource
Chinesisch